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{"sheet":"実験ノート1","index":0,"n_rows":39,"n_cols":5,"rows_kept":39,"cut":false,"hidden":false,"merged":[]}
["識別子","内容","メモ","記入要領","基本ルール"]
["SN:",null,"Version 20220415-2","シート番号。DB登録時に割り当てるので記入不要","・「セルの結合」は使わない。データや計算が見かけとずれる危険が高い"]
[" ",null,null,null,"・必要な情報のみ入力すればよい"]
["基本情報:[GeneralInformation]",null,null,null,"・タグ名は \"英数字-_\" + \":\""]
["[組織ID]OrganizationID:","東工大:TokyoTech:",null," ","・タグ名の前には []で囲んで説明を入れられる ([、]は使えない)。そのあとにタグ名を続ける"]
["[グループID]GroupID:","神谷・片瀬研",null," ","・各タグには、検索・データ処理可能な「内容」と、任意書式の「メモ」があり、いずれもDBに取り入れる。メモのタグ名は [TAG]_MEMO"]
["[実験者ID]PersonID:","選択してください",null,null,"・Loop: ～ EndLoop: でまとめたブロックの情報は、同じタグで複数記載可能"]
["[実験者名]PersonName:",null,null,"PersonIDで区別できる場合は記入不要","・タグはすべてリスト化(配列化)してDBに取り込む"]
[" ",null,null,null,"　そのため、シート内に同じタグが使われても構わない"]
["[年月日]Date:",null,null,"yyyy/mm/dd","・試料名、シーケンスなど、複数の内容がある場合は、改行あるいは,で区切る。"]
["[実験開始時刻]StratTime:",null,null,"hh:mm(:ss)","　各データの先頭、最後の空白は削除される"]
[" ","2023-01-13"]
["[部屋]Room:","選択してください",null,"フリーフォーマット","・Loop:下の最初のSampleID:より上の行の項目の変更はしない（マクロに影響がでるため）"]
[" "]
["[天気]Weather:","雨",null,null,"・「内容」例はイタリックで記入"]
["[温度]Temperature:"," 25C(9:00)-27C(12:00)-30C",null,"単位は C (℃)。時刻などと一緒に記録してよい"]
["[湿度]Moisture:",null,null,"単位は %。時刻などと一緒に記録してよい"]
["[実験終了時刻]EndTime:"]
["[実験概要]ExperimentalDescription:","デバイス特性測定",null,"合成、XRD測定など"]
[" "," "]
["Loop:測定情報:[MeasurementInformation]",null,null,"複数の情報を同じタグを使って記載できる"]
["[測定した試料名(ID)]SampleID:","MS0001-01\nMS0002",null,"改行や,で区切って複数指定可能\n例えば同じ行には、同じロットの試料を枝番で分ける\n異なる行の試料は別の条件・ロットの試料 などの区別が可能"]
["[装置ID]ApparatusID:","Resitest8300_COE_2F",null,"研究グループごとにIDを設定。\n共同研究の場合は \"組織ID:グループID:装置ID\" で識別"]
["[データファイル]DataFilePath:","Kamiya/20220224-MS0001-01-Wide.txt\nKamiya/20220224-MS0001-01-Wide.inf",null,"関連するファイルを(可能であれば)相対パスで指定\n装置書式ファイル、テキスト化ファイル、メタデータファイルなどがあればまとめて記録。ファイルタイプは拡張子か内容で自動判別"]
["[測定条件]MeasurementCondition:","20C air",null,"メタデータファイルなどに記録されていない条件"]
["EndLoop:測定情報:[MeasurementInformation]"]
[]
["[測定・解析結果要約]SummaryMeasurement:"," ",null,"自由記述\n(100)優先配向多結晶SnS\n\n"]
["[キャリアタイプ]Carrier type:"]
["[抵抗率]Resitivity (Ωcm):"]
["[キャリア濃度]Carrier density (cm-3):"]
["[移動度]Mobility (cm2/Vs):"]
["[活性化エネルギー]Activation energy (eV):"]
[]
["その他情報:[OtherInformation]",null,null,"これより下は、標準以外のタグ"]
[]
["[メモ]Memo:"," ",null,"自由記述"]
[]
["[修正記録]UpdateRecord:"]

{"sheet":"装置","index":1,"n_rows":23,"n_cols":5,"rows_kept":23,"cut":false,"hidden":false,"merged":[]}
["Miniflex_206","LFA_206","ZEM3_206","DSC_206","SEM_S8B1"]
["[サンプル形状]SampleShape:","a","[電極]Electrode:","a","[加速電圧]Acceleration voltage(keV):"]
["[ホルダー]Holder:","b","[幅]Width(mm):","c","[エミッション電流]Emittion cur.(microA):"]
[null,"c","[奥行]Depth(mm):","s","[SSM計数率モニタ]count rate:"]
["[長手制限スリット]IHS(mm):",null,"[高さ]Height(mm):",null,"[照射電流]Illumination cur.:"]
["[発散スリット]DS(deg):",null,"[電極中心間距離]Distance(mm):",null,"[カラムモード]Mode:"]
["[ 受光スリット]RS(mm):",null,"[テスター値]testerR(Ohm):",null,"[フィルター]Filter:"]
["[単色化]Monochromatization:",null,"[オーミック時の抵抗]Resistance(Ohm):",null,"[撮影距離]WD(mm):"]
[null,null,"[室温オーミック]RTOhmicConductivity(Sm-1):",null,"[表面処理]Surface treatment:"]
["[ファイル名]FileName:",null,null,null,"[サンプルホルダー]Holder:"]
["[ステップ]Step(deg):",null,"[開始温度]StartT(degC):",null,"[真空度]Vaccume(Pa):"]
["[スピード]ScanSpeed(deg/min):",null,"[最高温度]MaxT(degC):",null,"[PHAモード]PHA mode:"]
["[範囲]Range(deg):",null,"[ステップ温度]Step(degC):",null,"[解像度]Resolution:"]
[null,null,"dT(degC):",null,"[デュエルタイム]Dwell time(msec):"]
["[空間群]SpaceGroup:",null,"StabilityTime(min):",null,"[スイープ数]Sweep:"]
["[格子定数a]LatticeConstant(angstrom):",null,"SampleDev(degC):"]
["[格子定数b]LatticeConstant(angstrom):"]
["[格子定数c]LatticeConstant(angstrom):",null,"[エラー温度]ErrorT(degC):"]
["[本相割合]MainPhaseRatio(mol%):"]
["[相2]Phase2:"]
["[相2割合]Phase2Ratio(mol%):"]
["[相3]Phase3:"]
["[相3割合]Phase3Ratio(mol%):"]

{"sheet":"選択肢","index":2,"n_rows":10,"n_cols":13,"rows_kept":10,"cut":false,"hidden":false,"merged":[]}
["組織ID","グループID","実験者ID","実験室ID","実験の分類","製膜方法","測定装置ID",null,"Resitest8300_COE_2F","HP4155C_COE_2F","XRR_COE_2F_Smartlab","U4100_COE_1F","Seebeck_RT_COE_1F"]
["選択してください","選択してください","選択してください","選択してください","選択してください","選択してください","選択してください","XRD測定","[キャリアタイプ]Carrier type:","[閾値電圧]Vth (V):","[膜厚]thickness (nm):","[バンドギャップ]Eg (eV):","[ゼーベック係数]S(μV/K):"]
["東工大:TokyoTech:","神谷・片瀬研","神谷利夫","R3-301","合成:Synthesis:","PLD:","XRD_S8_5F_D8","XRR測定","[抵抗率]Resitivity (Ωcm):","[飽和移動度]μsat (cm2/Vs):","[密度]density (g/cm3):"]
["NIMS:",null,"片瀬貴義","S8-5F","薄膜成長:FilmGrowth:","Sputtering:","XRD_COE_2F_Smartlab","Hall効果測定","[キャリア濃度]Carrier density (cm-3):","[S値]S.S (V/decade):","[粗さ]roughness (nm):"]
["KEK:",null,"井手啓介","COE-1F","計測:Measurement:","MOCVD:","XRR_COE_2F_Smartlab","デバイス特性測定","[移動度]Mobility (cm2/Vs):","[逆バイアス耐圧]B.V:"]
["JFCC:",null,"清水篤","COE-2F","XRD測定:XRD:","Solution:","Resitest8300_COE_2F","光学スペクトル測定","[活性化エネルギー]Activation energy (eV):","[飽和電流]I0:"]
[null,null,null,"R3-213","PES測定:PES:",null,"HP4155C_COE_2F","ゼーベック測定","[粒内移動度]In-grain mobility (cm2/Vs):","[ダイオード因子]n:"]
[null,null,null,null,"計算:Calculation:",null,"U4100_COE_1F",null,null,"[ショットキー障壁高さ]Φb:"]
[null,null,null,null,null,null,"AFM_COE_1F",null,null,"[実効リチャードソン定数]A**:"]
[null,null,null,null,null,null,"Seebeck_RT_COE_1F"]